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Espec Tsa Manual 2017
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Sunn amp serial number lookup. Today’s more sophisticated, more highly integrated semiconductor devices are the result of ever more advanced microfabrication techniques and the use of new materials. Since these techniques and materials determine device life, high precision electromigration evaluations under more rigorous accelerated stress test conditions are becoming increasingly important to developers. The Electromigration Evaluation System offers high-precision measurement under temperature (up to 400°C) and current stresses ― the key conditions for accelerated stress testing.
- PDF Catalog (6.1MB)Thermal Shock Chambers. PDF Catalog (1.0MB)Large Type Air to Air Thermal Shock Chamber TSA Series Online Catalog; PDF Catalog (5.7MB)Thermal Shock Chambers (TSA.
- CAT.No.E16133-Z1609 Thermal Shock Chamber TSD-101-W TSE-12-A TW10B28C05 (The contents of this catalog is as of September, 2016.) Specifications are subject to change without notice due to design improvements. Corporate names and trade names mentioned in this catalog are trademarks or registered trademarks.
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